China Test Conference, a regular bi-annual academic conference in test technology sponsored by China Computer Society, deals in issues in components, circuits, electronic testing of systems and hardware and software, diagnosis, and information security. The previous 4 conferences were held in Beijing, Shanghai, Changsha, and Beidaihe. Now the 5th conference is scheduled on May 21st in Suzhou Industrial Park.

Being a major economic city in the Yangtze delta region with a clustered IC industrial chain and technical contingent and potential for hi-tech research and development, Suzhou has a sound industrial base to host the forthcoming conference, which will be jointly organized by China Computer Society and SIP Administrative Committee. Invited to the conference will be dozens of well-known experts including Prof. Tim Cheng of University of California and Prof. Wen Xiaoqing of Industrial University of Kyushu, Japan.